Quantitative Characterization of Micro-defect in Zircaloy Oxide Films

Long Chongsheng; Wei Tianguo; Chen Hongsheng; Xiao Hongxing; Zhao Yi

doi:10.13832/j.jnpe.2016.02.0087

Volume 37 Issue 2

Feb. 2025

Turn off MathJax

Article Contents

Article Navigation > Nuclear Power Engineering > 2016 > 37(2): 87-90

Long Chongsheng, Wei Tianguo, Chen Hongsheng, Xiao Hongxing, Zhao Yi. Quantitative Characterization of Micro-defect in Zircaloy Oxide Films[J]. Nuclear Power Engineering, 2016, 37(2): 87-90. doi: 10.13832/j.jnpe.2016.02.0087

Citation:

Long Chongsheng, Wei Tianguo, Chen Hongsheng, Xiao Hongxing, Zhao Yi. Quantitative Characterization of Micro-defect in Zircaloy Oxide Films[J]. Nuclear Power Engineering, 2016, 37(2): 87-90. doi: 10.13832/j.jnpe.2016.02.0087

Citation:

PDF( 811 KB)

Quantitative Characterization of Micro-defect in Zircaloy Oxide Films

doi: 10.13832/j.jnpe.2016.02.0087

Science and Technology on Reactor Fuel and Materials Laboratory, Nuclear Power Institute of China, Chengdu, 610041, China

Received Date: 2015-11-10
Rev Recd Date: 2015-12-10

Available Online: 2025-02-15

Abstract

Abstract

Basing on ion migration in xide films, a original method named IMM（Ion Migration Method） has been established to characterize the micro-defects in oxide films quantitatively. Several kinds of zircaloy oxide films formed at different corrosion conditions, were measured by IMM. On the basis of the results, it is concluded that IMM can distinguish the micro-defect difference between the different samples and the micro-defects evolution during the corrosion sensitively. After IMM has been further improved, it will be a effective method to analyse the microstructure of oxide films.
- Oxide film,
- Micro-defect,
- Quantitative characterization,
- Ion migration method