Structure Analysis of Film Formed by Reaction of CO2 and Zirconium Hydride
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摘要: 利用CO2、P与ZrH2反应生成约3~5μm厚的薄膜,用扫描电镜对薄膜横截面进行形貌观察;用X光电子能谱和X射线衍射对反应层表面进行分析。分析结果证明,所得到的氢化锆表面反应层致密,与基体结合良好,具有阻挡氢的能力;反应层中含有Zr、C、O等元素;除baddeleyite结构的ZrO2以外,还有具有C-H键和O-H键的物质。Abstract: A film with a thickness of 3~5μm was formed by the reaction of CO2 and zirconium hydride. Observation of the crosssection of the film by SEM found that the surface was combined tightly with the zirconium hydride. The film could be a hydrogen permeation barrier. XPS analysis showed that there were Zr, C and O in the film. Besides the ZrO2 baddeleyite, some O-H and C-H chemical bonding also existed in the film.
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Key words:
- Zirconium hydride /
- CO2 reaction /
- Hydrogen permeation barrier /
- Structure
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