小样本成败型设备可靠性评估方法

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Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern

College of Aerospace and Material Engineering, National University of Defense Technology, Changsha, 410073, China

摘要: 小样本、高可靠性成败型设备可靠性评估是核工程和航天工程领域经常遇到的难题。本文系统地分析了若干可靠性评估方法,包括Bayes方法、改进Bayes方法以及Bayes网络方法,同时结合相应的仿真算例说明了方法的应用,最后对成败型设备可靠性评估问题提出了一些结论和建议。
- 成败型设备 /
- 可靠性评估 /
- Bayes方法 /
- 数据质量因子 /
- Bayes网络
Abstract: Reliability assessment methods for devices with small-sample high-reliability safe-or-failure pattern are difficult problems in nuclear engineering and aerospace engineering.Some reliability assessment methods are analyzed thoroughly,including Bayesian statistics,improved Bayesian approach and Bayesian networks.Meanwhile the corresponding simulation examples are given to explain the application of the methods.Finally,some conclusions and advices are proposed for the device reliability assessment with only safe-or-failure pattern.
- Devices with only safe-or-failure pattern /
- Reliability assessment /
- Bayesian approach /
- Quality factors of prior and sample data /
- Bayesian networks