Performance Measurement of Aurum-Silicon Surface Barrier Detector in ⁶LiF Sandwich Semiconductor Spectrometer

The Aurum-Silicon surface barrier detector is one of the key consituents of the ⁶LiF semicon-ductor sandwich spectrometer, which parameters will directly affect the performance of ⁶LiF semiconductor sandwich spectrometer. In this paper, leakage current, dead-thickness, the effect of air on α partical, the effect of bias on the peak position and resolution under different bias and largest energy peak position under 180V bias for Aurum-Silicon surface barrier detectors are experimentally measured. Based on the measurment re-sults, two groups of Aurum-Silicon surface barrier detectors with similar performance are choosed to form the effective ⁶LiF Semiconductor sandwich spectrometer and the background spectrometer.