Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern

ZHANG Shi-feng; YANG Hua-bo; ZHANG Jin-huai

Oct. 2006

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Article Navigation > Nuclear Power Engineering > 2006 > 27(5): 79-83

ZHANG Shi-feng, YANG Hua-bo, ZHANG Jin-huai. Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern[J]. Nuclear Power Engineering, 2006, 27(5): 79-83.

Citation:

ZHANG Shi-feng, YANG Hua-bo, ZHANG Jin-huai. Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern[J]. Nuclear Power Engineering, 2006, 27(5): 79-83.

ZHANG Shi-feng, YANG Hua-bo, ZHANG Jin-huai. Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern[J]. Nuclear Power Engineering, 2006, 27(5): 79-83.

Citation:

ZHANG Shi-feng, YANG Hua-bo, ZHANG Jin-huai. Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern[J]. Nuclear Power Engineering, 2006, 27(5): 79-83.

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Reliability Assessment Methods with Small-Sample for Device with Only Safe-or-Failure Pattern

College of Aerospace and Material Engineering, National University of Defense Technology, Changsha, 410073, China

Received Date: 2005-01-24
Rev Recd Date: 2006-07-17

Available Online: 2025-07-29

Abstract

Abstract

Reliability assessment methods for devices with small-sample high-reliability safe-or-failure pattern are difficult problems in nuclear engineering and aerospace engineering.Some reliability assessment methods are analyzed thoroughly,including Bayesian statistics,improved Bayesian approach and Bayesian networks.Meanwhile the corresponding simulation examples are given to explain the application of the methods.Finally,some conclusions and advices are proposed for the device reliability assessment with only safe-or-failure pattern.
- Devices with only safe-or-failure pattern,
- Reliability assessment,
- Bayesian approach,
- Quality factors of prior and sample data,
- Bayesian networks