Design of Safety Logic Channel Periodic Test Device for HFETR

Wu Wenchao; Li Linhong; Li Pu; Chen Qibing; Li Ziyan

doi:10.13832/j.jnpe.2017.05.0077

Volume 38 Issue 5

Feb. 2025

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Wu Wenchao, Li Linhong, Li Pu, Chen Qibing, Li Ziyan. Design of Safety Logic Channel Periodic Test Device for HFETR[J]. Nuclear Power Engineering, 2017, 38(5): 77-80. doi: 10.13832/j.jnpe.2017.05.0077

Citation:

Wu Wenchao, Li Linhong, Li Pu, Chen Qibing, Li Ziyan. Design of Safety Logic Channel Periodic Test Device for HFETR[J]. Nuclear Power Engineering, 2017, 38(5): 77-80. doi: 10.13832/j.jnpe.2017.05.0077

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Design of Safety Logic Channel Periodic Test Device for HFETR

doi: 10.13832/j.jnpe.2017.05.0077

Nuclear Power Institute of China, Chengdu, 610213, China

Received Date: 2016-08-31
Rev Recd Date: 2017-03-21

Available Online: 2025-02-09

Abstract

Abstract

The safety logic channel periodic test device for high flux engineering test reactor（HFETR） was designed to detect the availability of the safety logic channel, and to find the reject-action fault of the safety logic channel. The operation principle and equipment composition of the device were introduced. The device was tested with manual and automatic modes. The effects of the test device on the logic channel were analyzed. Long-term operation practice shows that the safety logic channel periodic test device meets the test demand.
- High flux engineering test reactor（HFETR）,
- Safety logic channel,
- Periodic test device