Simulation Study on Fission Chamber Wide-Range Electronics

Luo Tingfang; Zhu Hongliang; Liu Lixin

doi:10.13832/j.jnpe.2017.06.0099

Volume 38 Issue 6

Feb. 2025

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Luo Tingfang, Zhu Hongliang, Liu Lixin. Simulation Study on Fission Chamber Wide-Range Electronics[J]. Nuclear Power Engineering, 2017, 38(6): 99-102. doi: 10.13832/j.jnpe.2017.06.0099

Citation:

Luo Tingfang, Zhu Hongliang, Liu Lixin. Simulation Study on Fission Chamber Wide-Range Electronics[J]. Nuclear Power Engineering, 2017, 38(6): 99-102. doi: 10.13832/j.jnpe.2017.06.0099

Luo Tingfang, Zhu Hongliang, Liu Lixin. Simulation Study on Fission Chamber Wide-Range Electronics[J]. Nuclear Power Engineering, 2017, 38(6): 99-102. doi: 10.13832/j.jnpe.2017.06.0099

Citation:

Luo Tingfang, Zhu Hongliang, Liu Lixin. Simulation Study on Fission Chamber Wide-Range Electronics[J]. Nuclear Power Engineering, 2017, 38(6): 99-102. doi: 10.13832/j.jnpe.2017.06.0099

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Simulation Study on Fission Chamber Wide-Range Electronics

doi: 10.13832/j.jnpe.2017.06.0099

Science and Technology on Reactor System Design Technology Laboratory, Nuclear Power Institute of China, Chengdu, 610213, China

Received Date: 2016-12-14
Rev Recd Date: 2017-07-11

Available Online: 2025-02-09

Abstract

Abstract

Using computer simulation technology, the impact of frequency band and noise in the fission chamber wide-range electronics is modeled and simulated. The analysis results show that the pulse counting mode is mainly influenced by the frequency band, and the upper limit of counting rate is about tenth of the frequency band under 10 MHz; the Campbell mode is influenced by the frequency band and noise level at the same time, 300 k Hz frequency band has an excellent signal to noise ratio, and lower noise level can effectively decreases the lower limit of counting rate.
- Fission chamber,
- Wide-range,
- Simulation