Various elements in stainless steel have been measured by X-ray fluorescence spectrometry. Spectral overlap and matrix effect of interference elements have been corrected by interfering. The precision and comparative tests show that the precision of the method(RSD) is less than 1% for the main portions of elements(Cr, Ni, Si, Mn, Ti, Mo, W), and the precision of the method(RSD) is less than 12% for the trace elements(Al, Cu, Co, Sn).